Akurasi Wavelenght–dispersive X-ray Flourescence

H. Widyatmoko
Journal article Makara Journal of Technology • Серпень 2004 Німеччина

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(Bahasa Indonesia, 8 pages)


Wavelenght-Dispersive X-Ray Flourescence Accuration. X-Fuorescence spectrometry is a method, which isincreasingly applied in the geochemical analysis. X-Fuorescence spectrometry is classified under two categories -WDXRF (wavelenght - dispersive X-ray fluorescence spectrometer) and EDXRF (energy-dispersive X - rayfluorescence spectrometer). WDXRF can be configured as a sequential spectrometer , a simultaneous spectrometer or ahibrid instrument, which combines the advantages of the simultaneous and sequential spectrometers into oneinstrument. Each instrument is different in some characteristics, and each has applications for which it is specificallysuited. In this investigation sequential spectrometer PW 1450 was used to analyze the major, minor and trace elementsin the samples. The standards used in calibrating the PW 1450 for the analysis of all samples are materials of knowncomposition (30 internatioanal standards and 66 standards from Institut für Mineralogie der Uni. Köln, Germany).Interelement and matrix effects are treated by matrix matching of samples and standards, dilution, preconcentration ofthe element of interest, and mathematic corrections during data analysis. The examination of two samples and thestatistic description using standard deviation and coefficient of variant show that the XFA is accurate enaugh for manyelements, especially for the major elements, but for Mg, Ca, K, Na, P, S, Co, Rb, Zn, Ni, Ba, Pb in comparison withAtomic Absorpsion Spectrometry (AAS), Flame Emission Spectrometer (FES), Inductively Coupled Plasma (ICP) andphotometer it is less sensitive. It is posible to devaluate the errors by using coefficient of variant and standarddeviation.




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